John Mansfield's
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  1. "Microstructural Investigation of AuGeNi contacts on InP", R. J. Graham, J. F. Mansfield & G. M. Rackham, Inst. Phys. Conf. Series No. 61, Chapter 11, p545.

  2. "Application of Convergent Beam Electron Microscopy to a Study of Interfaces in Semiconductor Devices", J. W. Steeds, R. J. Graham, G. M. Rackham, J. F. Mansfield & R. Vincent, Final Report on the CVD Project Number RU41-4, Oct 1980- Oct 1981.

  3. "Convergent Beam Electron Diffraction of Alloy Phases", The Bristol Group, Compiled by John F. Mansfield, pub. by Adam Hilger Ltd, Bristol, UK 1984.
  4. "Error Bars in CBED Symmetry ?", John F. Mansfield, Ultramicroscopy 18 (1985) pp. 91-96.

  5. "Medium-Voltage Analytical Electron Microscopy, Microanalysis Versus Radiation Damage", Nestor J. Zaluzec, John F. Mansfield, Paul R. Okamoto, & Nghi Q. Lam, Inst. Phys. Conf. Series No. 78, Chapter 6, (1986), pp. 173-176.

  6. "Digital Filters & Their Limitations in Data Analysis for Electron Energy Loss Spectroscopy", Nestor J. Zaluzec & John F. Mansfield, Inst. Phys. Conf. Series No. 78, Chapter 16, (1986), pp. 583-386.

  7. "Radiation Effects in X-Ray Microanalysis of a Light Element Alloy in a 300 kV Analytical Electron Microscope", John F. Mansfield, Paul R. Okamoto, Lynn E. Rehn & Nestor J. Zaluzec, Ultramicroscopy 21 (1987) 13-22.

  8. "Identification of Boron in M23X6 Precipitates in 316 Stainless Steel", John F. Mansfield, J. Mat. Sci. 22 (1987) 1277-85.

  9. "A Library of Convergent Beam Electron Diffraction Patterns", John F. Mansfield, Proc 44th EMSA, 1986, 688-691.

  10. "Sputtering, Radiation Damage & Microanalysis", Nestor J. Zaluzec & John F. Mansfield, Proc 44th EMSA, 1986, 708-709.

  11. "The Library of Convergent Beam Electron Diffraction Patterns: Update No. 1", John F. Mansfield, Yang-Pi Lin & Roger J. Graham, The Norelco Reporter, pub. by Philips Electronic Instruments Inc. Mahwah, New Jersey Vol 33 1EM 1986, 54-66.

  12. "Electron Sputtering in an AEM: Calculations & Experimental Data", John F. Mansfield & Nestor J. Zaluzec, in Intermediate Voltage Electron Microscopy, Philips Optics Publishing Group (1987) 29-31.

  13. "Examination of Anomalous Fringes in a Silicon 3% Germanium Alloy Layer - Evidence of a Superlattice?", J. F. Mansfield, D. M. Lee and G. A. Rozgonyi, Inst. Phys. Conf. Ser. No. 87 (1987) 169-174.

  14. "A Microstructural Study of Phases in the Y-Ba-Cu-0 System", A.I. Kingon, S. Chevacharoenkul & J.F. Mansfield, Advanced Ceramic Materials 2 678-687 3B (1987).

  15. "Space Group and Chemical Analysis of Y2BaCuO5-x by Convergent Beam Electron Diffraction and X-ray Energy Dispersive Spectroscopy.", John F. Mansfield, Sopa Chevacharoenkul & Angus I. Kingon, Appl. Phys. Lett. 51 (1987) 1035-1037.

  16. "Conventional Convergent Beam Electron Diffraction: Is Fingerprinting A Viable Interpretive Approach?", John F. Mansfield, Proc. AEM (1987) 138-141.

  17. "Critical Issues in CBED: Discussion", D. Bird, D.J. Eaglesham, H.L. Fraser, M.J. Kaufman, J.F, Mansfield & D.B. Williams, Proc. AEM (1987) 176-177.

  18. "Phase Identification by CBED Fingerprinting", Invited Paper. Presented at the 1987 TMS Fall Meeting, Cincinnati, OH. Oct 12-14. 1987.

  19. "A Quantitative Model for the Intergranular Precipitation of M7X3 and M23X6 in Ni- 16Cr-9Fe-C-B" R.M. Kruger, G.S. Was, J.F. Mansfield & J.R. Martin., Acta Met. 36 No12 (1988) p3163-76.

  20. "Practical Phase Identification by Convergent Beam Electron Diffraction", John F. Mansfield, Journal of Electron Microscopy Technique, (1989) p 3-15.

  21. "Molecular Beam Hetero-Epitaxial Growth of Strained InGaAs on GaAs", K. H. Chang, P. R. Berger, R. Gibala, P. K. Bhattacharya, J. Singh, J. F. Mansfield, & R. Clarke, in Dislocations and Interfaces in Semiconductors, Eds. K. Rajan, J. Narayan, D. Ast, (1988) 157-171.

  22. "Microstructural Studies of Sputter-Deposited TiN Ceramic Films.", A.R. Pelton, A.W. Dabrowski, L.P. Lehman, C. Ernsberger, A.E. Miller & J.F. Mansfield, Ultramicroscopy 29 (1989) 50-59.

  23. "Surface Cross-Hatched Morphology on Strained III-V Semiconductor Heterostructures" K.H. Chang, R. Gibala, D.J. Srolovitz, PK. Bhattacharya and J.F. Mansfield, Proc. Symp. D, Layered Strucutres: Heteroepitaxy, Superlattices, Strain and Metastability, Fall Meeting MRS Boston Nov 27 - Dec 2 1989. Mat. Res. Soc. Symp. Proc. Vol. 160 (1990) p129-134.

  24. "Cross-Hatched Surface Morphology in Strained III-V Semiconductor Films" K.H. Chang, R Gibala, D.J. Srolovitz, P.K. Bhattacharya and J.F. Mansfield. J. App. Phys. 67 (1990) p4093-4098.

  25. "Thickness Measurement in the Analytical Electron Microscope by Macintosh-based analysis of two-beam convergent beam patterns" John F. Mansfield & Douglas C. Crawford, Proc. XIIth Int. Cong. for EM (1990) p504-505.

  26. "Reliability Issues of InAlAs/InGaAs High-Electron-Mobility Transistors" M. Tutt, G.I. Ng, D. Pavlidis & J. Mansfield, Proc. 3rd Int. Conf. on InP, Cardiff, Wales U.K. April 1991.

  27. "Thickness Dependence of the Position of Higher Order Laue Zone Lines in Silicon" John F. Mansfield, David Bird & Martin Saunders, Proc. EMSA/MAS/MSC 1992, Ed. G.W. Bailey, J. Bentley & J. Small, p1182-3.

  28. "Kinetically Controlled Critical Thickness For Coherent Islanding and Thick Highly Strained Pseudomorphic Films of InGaAs on GaAs (100)", C.W. Snyder, J. F. Mansfield and B.G. Orr, Physical Review B (Condensed Matter), 46, no.15 (1992) 9551-54.

  29. "Thickness dependence of higher order Laue zone line positions at strongly dynamic zone axes." John F. Mansfield, David Bird & Martin Saunders, Ultramicroscopy 48 (1993) 1-11.

  30. "Analytical Electron Microscopy Studies of Mo5Si3-MoSi2 Eutectic Composites Modified by Erbium Additions", D.P. Mason, D.C. Van Aken & J.F. Mansfield, MRS Proceedings 1992.

  31. "Design And Construction Of An Electron Back-Scattering Pattern Camera For The Environmental Scanning Electron Microscope, John F. Mansfield, Visit Thaveeprungsriporn & Gary S. Was, Scanning 15 (1993) pIII36-III37.

  32. "Design & Construction Of A Tensile Stage For In-Situ Sample Bending In The ESEM" John F. Mansfield, Christine E. Kalnas, J. Wayne Jones, Gary S. Was & Ronald S. Kalnas, Scanning 15 (1993) PIII37-III38.

  33. "Determination Of Structure Factors Of Copper By Convergent Beam Electron Diffraction.", John Mansfield, Martin Saunders, George Burgess, David Bird & Nestor Zaluzec, Proc. 51st MSA (1993) p688-9.

  34. "Development of an Economical Electron Backscattering Diffraction System for an Environmental Scanning Electron Microscope." V. Thaveeprungsriporn, J.F. Mansfield, D.C. Crawford & G.S. Was, J. Mat. Res 9 (1994) p1887-1894.

  35. "An In Situ Bend Fixture For Deformation And Fracture Studies In The Environmental Scanning Electron Microscope" Kalnas, C.E., Mansfield, J.F., Was, G.S. and J.W. Jones, J. Vac. Sci. & Technol. A 12(3) (1994) p883-885.

  36. "Structural Investigation of Fe Silicide Films Grown by Pulsed Laser Deposition", O.P. Karpenko, C.H. Olk, S.M. Yalisove , J.F. Mansfield & G.L. Doll, J. Appl. Phys. 76 (1994) p2202-2207.

  37. "A Basic Introduction to Image Processing Using NIH-Image as a Model", John Mansfield, Proc 52nd MSA (1994) p392-393.

  38. "A Microstructural and Crystallographic Investigation of Directionally Solidified MoSi2-Mo5Si3 Eutectics", D. P. Mason, D. C. Van Aken and J. F. Mansfield, Acta metall. mater. 34 (1995) p1189-1199.

  39. "Backgating in Pseudomorphic In0.15Ga0.85As/Al0.25Ga0.75As MODFETs with a GaAs:Er buffer layer" S. Sethi, J. Mansfield, P.K. Bhattacharya, IEEE Electron Device Letters, 1995, IEEE Electron Device Letters Dec. 1995.

  40. "A Few Words On Bits & Bytes: A Tutorial On Image And Spectral Processing For The Novice", John F. Mansfield, , Proc Microscopy & Microanalysis 1995, Eds. G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p672-673.

  41. "The Development Of An Electronic Microscopy & Microanalysis Journal On The World Wide Web", John F. Mansfield, Microbeam Analysis 1995: Proceedings of the 29th Annual Conference of the Microbeam Analysis Society (1995), Ed. Edgar S. Etz, p407-408.

  42. "The Development Of An Electronic Microscopy Journal On The World Wide Web", Proc Microscopy & Microanalysis 1995 (1995), John F. Mansfield, Eds. G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p658-659.

  43. "In-situ Atomic Force Microscopy of Pt/Ti Film Morphology Changes On A Microelectronic Gas Sensor Operating At Elevated Temperatures.", M. DiBattista, S.V. Patel, J.F. Mansfield, J.L. Gland, J.W. Schwank, Proc Microscopy & Microanalysis 1995 (1995), Eds.G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p254-255.

  44. "Chemical Pressure and Charge Density Waves in Rare Earth Tellurides", E. DiMasi, M.C. Aronsen, J. F. Mansfield, B. Foran & S. Lee, Physical Review B 52 (1995) p14516.

  45. "Release Behavior from Ethylcellulose Coated Pellets: Thermomechanical and Electron Microbeam Studies", G.M. Derbin, B.O. Palsson, J.F. Mansfield, T.A. Wheatley, J.B. Dressman, Pharm. Tech. 1996 in press.

  46. "Surface Roughness Characterization of Nicalon and HI-Nicalon Ceramic Fibers by Atomic Force Microscopy," N. Chawla, J.W. Holmes, and J.F. Mansfield," Materials Characterization, 35 (1995) pp199-206.

  47. "The Teaching SEM - An Example of Real-Time Remote Control SEM", John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 394.

  48. "Digital Imaging - When Should One Take The Plunge?", John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 602.

  49. "A Survey of Detector Options for the "Leaky-Vacuum" SEM, Stuart McKernan & John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 832.

  50. "Characterization of Multilayer Thin Film Structures for Gas Sensor Applications", M. DiBattista, S.V. Patel, K. D. Wise, J. L. Gland, J. Mansfield, and J. W. Schwank, in MRS, Vol. 382, Structure and Properties of Multilayered Thin Films, T. D. Nguyen, B.M. Lairson, B. M. Clemens, K. Sato, S.-C. Shin, Eds., 1995.

  51. "Biological and Materials Science Applications of Environmental Electron Microscopy", John F. Mansfield, Journal of The Electron Microscopy Society of Thailand, 11 (1996) 22.

  52. "Applications of the Environmental Scanning Electron Microscope", John Mansfield, Proceedings of EUREM 1996, Dublin Eire. Published on CD-ROM.

  53. "Review of Techniques for Overcoming XEDS Problems in the Environmental Scanning Electron Microscope", John F. Mansfield, Microscopy & Microanalysis, 3 Supplement 2 (1997) Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 1207.

  54. "TEM Studies of Silicon Nitride-Silicon Carbide Nanocomposites" E.Y. Wang, X. Pan, J.F. Mansfield, T. Kennedy & S. Hampshire", Microscopy & Microanalysis, 3 Supplement 2 (1997) Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 411.

  55. "A Microfabricated Hot Stage for Scanning Probe Microscopes, Michael DiBattista, Sanjay V. Patel, John F. Mansfield, John L. Gland, and Johannes W. Schwank , submitted to Scanning 1998.

  56. "In-situ elevated temperature imaging of thin films with a microfabicated hot stage for scanning probe microscopes", Michael DiBattista, Sanjay V. Patel, John F. Mansfield & Johannes W. Schwank, Applied Surface Science 141 (1999) p119-128.

  57. "Quicktime as a Storage Medium for Dynamic Date Sets in In-Situ Electron Microscopy", John F. Mansfield, Microscopy and Microanalysis 4 (1998) 4.

  58. "A Telepresence Microscopy Research Session in the DOE2000 Materials Microcharacterization Collaboratory", L.F. Allard, E. Voelkl, T.A. Nolan, C.K. Narula, C. Montreuil, W.C. Bigelow and J.F. Mansfield, Microscopy and Microanalysis 4 (1998) 20.

  59. "Real-Time Remote Control of a Scanning Electron Microscope across the vBNS/Internet2", John F. Mansfield, Microscopy and Microanalysis 4 (1998) 44.
  60. "X-ray Energy Dispersive Spectroscopy in the Environmental Scanning Electron Microscope", John F. Mansfield and Brett L. Pennington, Microscopy and Microanalysis 4 (1998) 182.

  61. "Design and Construction of a Quantitative Uniaxial Straining Stage for the Environmental SEM", John F. Mansfield, Micheal D. Thouless, Justin A. Stefano and Judd Holbrook, Microscopy and Microanalysis 4 (1998) 268.

  62. "Determination of lattice parameter, oxidation state, and composition of individual titanomagnetite/titanomaghemite grains by transmission electron microscopy", Weiming Zhou, Donald R. Peacor, Rob Van der Voo, and John F. Mansfield, 1999. Journal of Geophysical Research, 104 (1999) 17689-17702.

  63. "An Introduction to Electronic Document Preparation and Submission for Future Microscopy and Microanalysis Meetings", Microscopy and Microanalysis, 5 (Suppl. 2: Proceedings) (1999), 520-521.

  64. "Environmental SEM Study of Sodium Alginate Beads", John Mansfield, Petra Eiselt, Julia Yeh and David J. Mooney, Microscopy and Microanalysis, 5 (Suppl. 2: Proceedings) (1999) 300-301.

  65. "Full, Real-Time Remote Control Of A Scanning Electron Microscope With A Compact Laptop Computer Via A High Speed Network", John F. Mansfield, Andy Adamson & Kevin Coffman, Microscopy and Microanalysis 6 (2000) 31-41.

  66. "X-ray Microanalysis in the Environmental SEM: A Challenge or a Contradiction?", John F. Mansfield, Mikrochimica Acta, 132 (2000) 137-143.

  67. "Bismuth Nanowire Arrays: Syntesis and Galvanometric Properties", J.M. Heremans, C.M. Thrush, Yu-min Lin, S. Cronin, Z. Zhang, M.S. Dresselhaus & J.F. Mansfield, Physical Review B, 61 (2000) 2921-2930.

 

Copyright © 2000 EMAL & MSE Department, University of Michigan
Last modified  by John F. Mansfield

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