Curriculum Vitae of John Francis Mansfield

Electron Microbeam Analysis Laboratory 

Rm 417 

2455 Hayward Street

Ann Arbor

Michigan 48109-2143

Phone: (313)-936-3352

FAX: (313)-936-3352

Email: John.F.Mansfield@umich.edu

URL: http://emalwww.engin.umich.edu/people/jfmjfm/

Education

1976-1979:  School of Chemical Physics, Univ. of Bristol, Bristol, UK.  B.Sc. Honours II(ii)  in Chemical Physics.

1979-1980:  H.H. Wills Physics Laboratory, Tyndall Ave., Bristol, UK.  M.Sc. in The Physics of Materials.  Thesis: A Microstructural Investigation of Au-Ge-Ni Contacts to InP.

1980-1983:  EM Group, H.H. Wills Physics Laboratory, Bristol, UK.  Ph.D. in Physics.  Thesis: The Role of Boron in the Creep Ductility of 316 Stainless Steel.

Professional Experience

06-12 1983:  Electron Microscopy Group, H.H. Wills Physics Laboratory,Tyndall Avenue, Bristol, UK.  Post-Doctoral Assistant.

02-1984 to  08-1986:  Electron Microscopy Center for Materials Research, Argonne National Laboratory, Argonne,  Illinois, 60439.  Post-Doctoral Appointee.

09-1986 to 07-1987:  Microelectronics Center of North Carolina, 3021 Cornwallis Road, Research Triangle Park, NC, 27709.  Visiting Scientist.

08-1987 to 08-1994:  Electron Microbeam Analysis Laboratory, University of Michigan, 2455 Hayward Street, Ann Arbor, Michigan 48109-2143.  Assistant Research Scientist and Laboratory Manager.

08-1994 to 2005:  Electron Microbeam Analysis Laboratory, University of Michigan, 2455 Hayward Street, Ann Arbor, Michigan 48109-2143.  Associate Research Scientist and Laboratory Manager.

09-2005 to present:  Electron Microbeam Analysis Laboratory, University of Michigan, 2455 Hayward Street, Ann Arbor, Michigan 48109-2143.  Associate Research Scientist, Laboratory Manager and Associate Laboratory Director.


Professional Societies

Institute of Physics

American Physical Society

Microscopy Society of America

Microbeam Analysis Society



Research Interests

  1. Primary interest is the development, application, and advancement of microstructural and microchemical analysis of materials (metals, semiconductors, and superconductors), using analytical electron microscopy.  Techniques used are convergent beam electron diffraction (CBED), X-ray energy dispersive spectroscopy (XEDS), and electron energy loss spectroscopy (EELS). 
  2. Applications of environmental scanning and electron microscopy and integrated focused ion beam systems.
  3. Use of scanning electron microscopy in undergraduate materials science teaching.
  4. Development of computer-aided analysis for electron microanalysis and electron microscope imaging. 
  5. Study of cultural heritage artifacts with advanced micro and nano characterization techniques.
  6. Development of tools for teaching electron diffraction, particularly computer-aided visualization of convergent beam diffraction patterns


Invited Talks, Workshops and Short Courses (1999-present)

  1. “An Introduction to Electronic Document Preparation and Submission for Future Microscopy and Microanalysis Meetings”, at Microscopy and Microanalysis 1999 in Portland Oregon, July 3rd 1999.
  2. “Environmental Scanning Electron Microscopy of Materials”, Florida branch of he American Vacuum Society and Florida Society For Microscopy meeting at UCF, Orlando, FL, March 12th – 14th 2000.
  3. “Remote control of a scanning electron microscope for research and teaching”, John F. Mansfield, invited talk at The International Kunming Symposium on Microscopy, Kunming, China, July 2-5 2000.
  4. “Electron Backscattering in the Environmental Scanning Electron Microscope – The Pressure Limit”, John F. Mansfield, invited talk at The Sixth Biennial Australian Microbeam Analysis Society Symposium  in Conjunction with the Third Scanned Probe Microscopy Conference, University of Sydney February 14th-16th 2001.
  5. Lehigh Microscopy School, Bethlehem, Pa, first week of June 2000-2003. Teaching three classes on remote control of the scanning electron microscope across Internet 2.
  6. “Scanning Electron Microscopy in Materials Science", a series of presentations to 5-8th grade girls at the Sally Ride Science Festival held in the College of Engineering, July 2002
  7. "Remote Scanning Electron Microscopy, a Materials Science and Emerson School Science Fair, April 2002.
  8. Saturday Morning Seminars "Scanning Electron Microscopy in Materials Science, why we have to look at really small stuff". Lecture demonstration to a group seniors from across the state. 18th of May 2002.
  9. "An Internet2 Demonstration: Remote Control of an SEM" at Western Materials Science Students Night, Kalamazoo, 24th April 2003.
  10. “Environmental Scanning Electron Microscopy – Road Map II” an invitees only workshop held at The Hydro Majestic Hotel, Medlow Bath, NSW, Australia, February 17th-19th 2001.
  11. "Scanning Electron Microscopy in Materials Science", a series of presentations to 5-8th grade girls at the Sally Ride Science Festival held in the College of Engineering, Sept 2003.
  12. Saturday Morning Seminars "Scanning Electron Microscopy in Materials Science, Why we have to look at really small stuff". Lecture demonstration to a group of high school juniors and seniors from across the state. May 2003.
  13. Presentation of “Microscopy and Materials Teaching with Remote SEM” at the National Internet 2 Day, Internet2 Offices, Ann Arbor, MI.  March 18th 2004.
  14. Lecturer at “The Lehigh Microscopy School”, Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA. first week of June, 6 2004-present. Live remote classes in basic SEM using the EMAL XL30FEG, remote classes on focussed on beam techniques using the FEI Nova and Helios Nanolabs, remote class on microprobe on the Cameca SX100 electron microprobe analyzer and a lecture entitled “An Introduction to Environmental and Variable Pressure Scanning Electron Microscopy.”
  15. Invited talk “Nanofabrication with Ion Beams Visualized in the Environmental Scanning Electron Microscope” at Microscopy & Microanalysis 2005, Honolulu, Hawaii, July 31st - August 4th 2005.
  16. Sole lecturer at a one-day workshop on “Remote Microscopy” at “The 8th Inter American Congress of Electron Microscopy”, Hotel National de Cuba, Havana, Cuba, September 29th 2005.
  17. Invited talk entitled “FIB and ESEM” at “The 8th Inter American Congress of Electron Microscopy”, Hotel National de Cuba, Havana, Cuba, September 26th 2005.
  18. “High Quality Electron Beams from Laser Wakefield Acceleration: A New Compact Source for Electron Microscopes?” at Microscopy & Microanalysis 2005, Honolulu, Hawaii, July 31st - August 4th 2005.
  19. “Remote Microscopy Demonstrations & Lecture at “Next Generation Networking:
    High Performance for Higher Education”, Wednesday, November 30, 2005 Washtenaw Community College, Ann Arbor, MI.
  20. “Vietnam Research Management Workshop” Workshop for researchers and research managers sponsored by the Vietnamese Ministry of Science and Technology and the Vietnam Education Foundation, with Fawwaz Ulaby, Kazuhiro Saitou and Virginia Waite, Feb 27th and 28th 2006 in Hanoi and March 2nd and 3rd  2006 in Ho Chi Minh City.
  21. “Teaching the Use of a Scanning Electron Microscope Remotely” The Merit Next Generation Networking Demonstration held at Grand Rapid Community College, Grand Rapids, Michigan, March 10th. 2006.
  22. Teaching a High School Student from Washington Lee High School in Arlington, VA to use the EMAL XL30FEG SEM remotely at “Broadband Without Boundaries” a workshop/demonstration presented byInternet2® and EDUCAUSE at the Library of Congress Thomas Jefferson Building, Room LJ119, April 25, 2006 5:30pm to 7:30pm.
  23. XXI Brazilian Meeting of the Society for Microscopy and Microanalysis, Closing Presentation: 29th August 2007.  Entitled: “Remote Control Microscopy”
  24. CIASEM 2007 (Congreso Interamericano de Microscopia Electronica) Plenary Talk: “Remote Microscopy, FIB and Microprobe - Technique Teaching for Large Groups”, presented September 24, 2007.
  25. International Workshop on Remote Electron Microscopy for In-Situ Studies at Stanford University, March 31st to April 1st 2008 – Presentation entitled “Remote Microscopy: Training Groups of Student Users” given on March 31st 2008.
  26. “Microscopy at Michigan – an overview of Materials and Biomaterials Microscopy at the University of Michigan”, presentation given to members of Microscopy New Zealand at Auckland University, Auckland, New Zealand, 21st February 2008.
  27. Two lectures on Focused Ion Beam Techniques at the pre-meeting workshop entitled “FIB from Afar”, part of the 20th Australian Conference on Microscopy and Microanalysis and the 4th Congress of the International Union of Microbeam Analysis Societies, Sunday February 10th 2008.
  28. Invited talk entitled “Remote Instrument Control for Technique Teaching” at he 20th Australian Conference on Microscopy and Microanalysis and the 4th Congress of the International Union of Microbeam Analysis Societies, Tuesday February 12th 2008.
  29. Joint invited Tutorial with Joe Michael of Sandia National Laboratories entitled “FIB methods and applications i.e., FIB-EPMA/ FIB-SIMS” at the 20th Australian Conference on Microscopy and Microanalysis and the 4th Congress of the International Union of Microbeam Analysis Societies, Thursday February 14th 2008.
  30. “Materials Microscopy at Michigan”, invited talk in the Department of Chemistry Seminar series at Western Michigan University, December 8th 2008.
  31.   “Environmental Scanning Electron Microscopy: Example Applications”, invited talk at the Advanced Technology Research Center, Oklahoma State University, February 16th 2009. 
  32. “Remote Microscopy for Training Groups of Student Users and for Collaborative Research”, invited talk at the 2nd International Workshop on Remote Electron Microscopy for In Situ Studies, Chalmers University, Gothenburg, Sweden, November 16-18, 2009.
  33. “Plenary Remote Session” invited presentation and remote control demonstration from Chalmers University to Ann Arbor at the 2nd International Workshop on Remote Electron Microscopy for In Situ Studies, Chalmers University, Gothenburg, Sweden, November 16-18, 2009.
  34. “Remote Microscopy for Training Groups of Student Users”, invited talk at Stockholm University, Stockholm , Sweden, November 19th, 2009.
  35. Chair of Remote Control Symposium at IMC-17 the 17th International Microscopy Conference, Rio De Janeiro, Brazil, September 19-24th, 2010.
  36. “SEM and XEDS Analysis of Cultural Heritage Artifacts: 19th Century Paintings, Antique Vehicles and Ancient Coinage”, invited talk at the 11th Interamerican Congress on Microscopy (CIASEM), September 25-29th 2011.
  37. “SEM and XEDS Analysis of Cultural Heritage Artifacts: 19th Century Paintings, Antique Vehicles and Ancient Coinage”, invited talk at Tokyo University of the Arts, December 15th 2011.
  38. Short Course with Nestor Zaluzec of Argonne National Laboratory entitled “Fundamentals of Transmission Electron Microscopies” at the 10th Asia-Pacific Microscopy Conference (APMC 10), the 2012 International Conference on Nanoscience and Nanotechnology (ICONN 2012) and the 22nd Australian Conference on Microscopy and Microanalysis (ACMM 22), Perth, Western Australia, February 5th-9th 2012.
  39. One Day Workshop with Paul Munroe of the University of New South Wales, entitled “Good practice with FIB”, at the 10th Asia-Pacific Microscopy Conference (APMC 10), the 2012 International Conference on Nanoscience and Nanotechnology (ICONN 2012) and the 22nd Australian Conference on Microscopy and Microanalysis (ACMM 22), Perth, Western Australia, February 5th-9th 2012.
  40. “Applications of environmental scanning electron microscopy, X-ray energy dispersive spectrometry and focussed ion beam techniques to cultural heritage research”, invited talk at the 15th European Microscopy Congress 2012, Manchester Central, UK, 16t-21st September 2012.
  41. “”Introduction to SEM”, invited workshop at at the 12th Australian Microbeam Analysis Society meeting, University of Technology Sydney, Sydney, Australia, February 4th-8th 2013.
  42. “Microanalytical study of paint samples from Salvator Mundi  in the collection of the Detroit Institute of Arts”, invited talk at the 12th Australian Microbeam Analysis Society meeting, University of Technology Sydney, Sydney, Australia, February 4th-8th 2013.
  43. “The Art of Microscopy and Microanalysis: Materials Science Analysis of Cultural Heritage Artifacts”, invited talk at the1st Nagoya University-University of Michigan Faculty Workshop on Engineering, March 5th, 2013.
  44.   “Materials Analysis and Cultural Heritage - The crossroads of microscopy and art.” departmental seminar at the Department of Materials Engineering, McGill University, Montréal, Québec, Canada, March 22nd, 2013.


Conference Abstracts

  1. “Remote control of a scanning electron microscope for research and teaching”, John F. Mansfield, Andy Adamson and Kevin Coffman, Proceedings of The International Kunming Symposium on Microscopy, Kunming, China, July 2-5 2000, (2000) pp 33-35.
  2. “Analytical Electron Microscopy Studies of Mo5Si3-MoSi2 Eutectic Composites Modified by Erbium Additions”, D.P. Mason, D.C. Van Aken & J.F. Mansfield, MRS Proceedings 1992.
  3. “Electron Backscattering in the Environmental Scanning Electron Microscope  The Pressure Limit”, John F. Mansfield, Symposium V: Low Vacuum SEM/ESEM in Materials Science - Wet SEM- the Liquid Frontier of Microscopy, Fall Meeting of MRS, Boston, Mass, Nov 27th – Dec 1st 2000.
  4. “Electron Backscattering in the Environmental Scanning Electron Microscope – The Pressure Limit”, John F. Mansfield, Proceedings of the AMAS VI, University of Sydney February 14th-16th 2001.
  5. Chen H, Spencer NJ, Chang SR, Mansfield JF, Clarkson BH: Effects of Fluoride Ions on Surface Roughness of Enamel Crystals, IADR/AADR/CADR 82, General Session, March 10-13, 2004, Honolulu, Hawaii.
  6. Chen H, Czajka-Jakubowska A, Mansfield JF, Clarkson BH: Direct synthesis of human enamel-like structure in vitro, submitted to AADR/IADR/CADR 85th General Session, Orlando, FL, March 8-11, 2006.
  7. “FIB Methods and Applications in the Modern Analytical Laboratory”, John Mansfield and Joe Michael, Proceedings of ACMM-20 and IUMAS-IV “Through the Looking Glass”, 2008 p193-4.
  8. “Remote Microscopy for Training Groups of Student Users”, John F. Mansfield, Proceedings of ACMM-20 and IUMAS-IV “Through the Looking Glass”, 2008 p146-147.
  9. “Remote Microscopy, FIB and Microprobe - Technique Teaching for Large Groups”, John F. Mansfield, Acta Microscopica Vol 16 No1-2, (Supp.2) 2007, Article 2.
  10.   “Remote Microscopy, FIB and Microprobe - Technique Teaching for Large Groups”, John F. Mansfield, Proceedings of XXI CSBMM 2007.
  11. “Daguerreotypes and Focused Ion Beams – A Novel Route To Restoration?, Elise A Gregory, Matthew Parayil, Cathy Selvius Deroo & John F. Mansfield. Acta Microscopica Vol 16 No1-2, (Supp.2) 2007, Article 86.
  12. “Characterization and Restoration of 19th Century Daguerreotypes by SEM XEDSand FIB”, EA Gregory, CS DeRoo and JF Mansfield, Microscopy and Microanalysis, Volume 13, Supplement S02, Aug 2007, pp 1422-1423.
  13. “SEM and XEDS Fingerprinting of the Second World War Era Medals to Identify Counterfeits”,  A Aneja, D Maerz and JF Mansfield, Microscopy and Microanalysis, Volume 13, Supplement S02, Aug 2007, pp 1420-1421.
  14. “Remote Microscopy for Training Groups of Student Users”, JF Mansfield, Microscopy and Microanalysis, Volume 14, Supplement S2, July 2008, pp 876 - 877.
  15. “Domain Structure Control of BiFeO3 Films Through Substrate Symmetry and Film Thickness”, CT Nelson, Y Zhang, CM Folkman, CB Eom, JF Mansfield and XQ Pan, Microscopy and Microanalysis, Volume 15, Supplement S2, June 2009, pp 1030 - 1031.
  16. “Plasmon Loss Spectroscopy of Au/ZnO Nanoparticles: Prospects for Ultrafast Dynamics in Hybrid Nanostructures”, T Norris, NJ Zaluzec, JF Mansfield, M Yang, N Kotov, M N'Gom and E Olsson,  Microscopy and Microanalysis, Volume 16 , Supplement S2, June 2010, pp 506 - 507.


Awards (2002-present)

1. The 2002 Presidential Service Award from the Microbeam Analysis Society for dedicated service and support to the society, awarded at the Microscopy and Microanalysis Meeting inQuebec City, Quebec, August 2002.

2. MSA Council Service Award, presented at Microscopy & Microanalysis Meeting, San Antonio, TX, August 2003.


Publications.

  1. "Microstructural Investigation of AuGeNi contacts on InP", R. J. Graham, J. F. Mansfield & G. M. Rackham, Inst. Phys. Conf. Series No. 61, Chapter 11, p545.
  2. "Convergent Beam Electron Diffraction of Alloy Phases", The Bristol Group, Compiled by John F. Mansfield, pub. by Adam Hilger Ltd, Bristol, UK 1984.
  3. "Error Bars in CBED Symmetry ?", John F. Mansfield, Ultramicroscopy 18 (1985) pp. 91-96.
  4. "Medium-Voltage Analytical Electron Microscopy, Microanalysis Versus Radiation Damage", Nestor J. Zaluzec, John F. Mansfield, Paul R. Okamoto, & Nghi Q. Lam, Inst. Phys. Conf. Series No. 78, Chapter 6, (1986), pp. 173-176.
  5. "Digital Filters & Their Limitations in Data Analysis for Electron Energy Loss Spectroscopy", Nestor J. Zaluzec & John F. Mansfield, Inst. Phys. Conf. Series No. 78, Chapter 16, (1986), pp. 583-386.
  6. "Radiation Effects in X-Ray Microanalysis of a Light Element Alloy in a 300 kV Analytical Electron Microscope",  John F. Mansfield, Paul R. Okamoto, Lynn E. Rehn & Nestor J. Zaluzec, Ultramicroscopy 21 (1987) 13-22.
  7. "Identification of Boron in M23X6 Precipitates in 316 Stainless Steel", John F. Mansfield,  J. Mat. Sci. 22 (1987) 1277-85.
  8. "A Library of Convergent Beam Electron Diffraction Patterns", John F. Mansfield,  Proc 44th EMSA, 1986, 688-691.
  9. "Sputtering, Radiation Damage & Microanalysis", Nestor J. Zaluzec & John F. Mansfield, Proc 44th EMSA, 1986, 708-709
  10. "The Library of Convergent Beam Electron Diffraction Patterns: Update No. 1", John F. Mansfield, Yang-Pi Lin & Roger J. Graham, The Norelco Reporter, pub. by Philips Electronic Instruments Inc. Mahwah, New Jersey Vol 33 1EM 1986, 54-66.
  11. "Electron Sputtering in an AEM: Calculations & Experimental Data", John F. Mansfield & Nestor J. Zaluzec, in Intermediate Voltage Electron Microscopy, Philips Optics Publishing Group (1987) 29-31.
  12. "Examination of Anomalous Fringes in a Silicon 3% Germanium Alloy Layer - Evidence of a Superlattice?", J. F. Mansfield, D. M. Lee and G. A. Rozgonyi, Inst. Phys. Conf. Ser. No. 87 (1987) 169-174.
  13. "A Microstructural Study of Phases in the Y-Ba-Cu-0 System", A.I. Kingon, S. Chevacharoenkul & J.F. Mansfield,  Advanced Ceramic Materials 2 678-687 3B (1987).
  14. "Space Group and Chemical Analysis of  Y2BaCuO5-x by Convergent Beam Electron Diffraction and X-ray Energy Dispersive Spectroscopy.", John F. Mansfield, Sopa Chevacharoenkul & Angus I. Kingon, Appl. Phys. Lett. 51 (1987) 1035-1037.
  15. "Conventional Convergent Beam Electron Diffraction: Is Fingerprinting A Viable Interpretive Approach?", John F. Mansfield, Proc. AEM (1987) 138-141.
  16. "Critical Issues in CBED: Discussion", D. Bird, D.J. Eaglesham, H.L. Fraser, M.J. Kaufman, J.F, Mansfield & D.B. Williams, Proc. AEM (1987) 176-177.
  17. "Phase Identification by CBED Fingerprinting", Invited Paper.  Presented at the 1987 TMS Fall Meeting, Cincinnati, OH. Oct 12-14. 1987
  18. "A Quantitative Model for the Intergranular Precipitation of M7X3 and M23X6 in Ni- 16Cr-9Fe-C-B" R.M. Kruger, G.S. Was, J.F. Mansfield & J.R. Martin., Acta Met. 36 No12 (1988) p3163-76.
  19. "Practical Phase Identification by Convergent Beam Electron Diffraction", John F. Mansfield,  Journal of Electron Microscopy Technique, (1989) p 3-15.
  20. "Molecular Beam Hetero-Epitaxial Growth of Strained InGaAs on GaAs", K. H. Chang, P. R. Berger, R. Gibala, P. K. Bhattacharya, J. Singh, J. F. Mansfield, & R. Clarke, in Dislocations and Interfaces in Semiconductors, Eds. K. Rajan, J. Narayan, D. Ast, (1988) 157-171.
  21. "Microstructural Studies of Sputter-Deposited TiN Ceramic Films.", A.R. Pelton, A.W. Dabrowski, L.P. Lehman, C. Ernsberger, A.E. Miller & J.F. Mansfield, Ultramicroscopy 29 (1989) 50-59.
  22. "Surface Cross-Hatched Morphology on Strained III-V Semiconductor Heterostructures" K.H. Chang, R. Gibala, D.J. Srolovitz, PK. Bhattacharya and J.F. Mansfield, Proc. Symp. D, Layered Strucutres: Heteroepitaxy, Superlattices, Strain and Metastability, Fall Meeting MRS Boston Nov 27 - Dec 2 1989. Mat. Res. Soc. Symp. Proc. Vol. 160 (1990) p129-134.
  23. "Cross-Hatched Surface Morphology in Strained III-V Semiconductor Films" K.H. Chang, R Gibala, D.J. Srolovitz, P.K. Bhattacharya and J.F. Mansfield. J. App. Phys. 67 (1990) p4093-4098.
  24. "Thickness Measurement in the Analytical Electron Microscope by Macintosh-based analysis of two-beam convergent beam patterns" John F. Mansfield & Douglas C. Crawford, Proc. XIIth Int. Cong. for EM (1990) p504-505.
  25. "Reliability Issues of InAlAs/InGaAs High-Electron-Mobility Transistors" M. Tutt, G.I. Ng, D. Pavlidis & J. Mansfield, Proc. 3rd Int. Conf. on InP, Cardiff, Wales U.K. April 1991.
  26. "Thickness Dependence of the Position of Higher Order Laue Zone Lines in Silicon" John F. Mansfield, David Bird & Martin Saunders, Proc. EMSA/MAS/MSC 1992, Ed. G.W. Bailey, J. Bentley & J. Small, p1182-3.
  27. “Kinetically Controlled Critical Thickness For Coherent Islanding and Thick Highly Strained Pseudomorphic Films of InGaAs on GaAs (100)”, C.W. Snyder, J. F. Mansfield and B.G. Orr, Physical Review B (Condensed Matter), 46, no.15 (1992) 9551-54.
  28. "Thickness dependence of higher order Laue zone line positions at strongly dynamic zone axes.” John F. Mansfield, David Bird & Martin Saunders, Ultramicroscopy 48 (1993) 1-11.
  29. “Design And Construction Of An Electron Back-Scattering Pattern Camera For The Environmental Scanning Electron Microscope, John F. Mansfield, Visit Thaveeprungsriporn & Gary S. Was, Scanning 15 (1993) pIII36-III37
  30. “Design & Construction Of A Tensile Stage For In-Situ Sample Bending In The ESEM” John F. Mansfield, Christine E. Kalnas, J. Wayne Jones, Gary S. Was & Ronald S. Kalnas, Scanning 15 (1993) PIII37-III38
  31. “Determination Of Structure Factors Of Copper By Convergent Beam Electron Diffraction.”, John Mansfield, Martin Saunders, George Burgess, David Bird & Nestor Zaluzec, Proc. 51st MSA (1993) p688-9.
  32. “Development of an Economical Electron Backscattering Diffraction System for an Environmental Scanning Electron Microscope.” V. Thaveeprungsriporn, J.F. Mansfield, D.C. Crawford & G.S. Was, J. Mat. Res 9 (1994) p1887-1894.
  33. “An In Situ Bend Fixture For Deformation And Fracture Studies In The Environmental Scanning Electron Microscope” Kalnas, C.E., Mansfield, J.F., Was, G.S. and J.W. Jones, J. Vac. Sci. & Technol. A 12(3) (1994) p883-885.
  34. “Structural Investigation of Fe Silicide Films Grown by Pulsed Laser Deposition”, O.P. Karpenko, C.H. Olk, S.M. Yalisove , J.F. Mansfield & G.L. Doll, J. Appl. Phys. 76 (1994) p2202-2207.
  35. "A Basic Introduction to Image Processing Using NIH-Image as a Model", John Mansfield, Proc 52nd MSA (1994) p392-393
  36. “A Microstructural and Crystallographic Investigation of Directionally Solidified MoSi2-Mo5Si3 Eutectics”, D. P. Mason, D. C. Van Aken and J. F. Mansfield, Acta metall. mater. 34 (1995) p1189-1199.
  37. “Backgating in Pseudomorphic In0.15Ga0.85As/Al0.25Ga0.75As MODFETs with a GaAs:Er buffer layer” S. Sethi, J. Mansfield, P.K. Bhattacharya, IEEE Electron Device Letters, 1995, IEEE Electron Device Letters Dec. 1995.
  38. “A Few Words On Bits & Bytes: A Tutorial On Image And Spectral Processing For The Novice”, John F. Mansfield, , Proc Microscopy & Microanalysis 1995, Eds. G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p672-673.
  39. “The Development Of An Electronic Microscopy & Microanalysis Journal On The World Wide Web”, John F. Mansfield, Microbeam Analysis 1995: Proceedings of the 29th Annual Conference of the Microbeam Analysis Society (1995), Ed. Edgar S. Etz,  p407-408.
  40. “The Development Of An Electronic Microscopy Journal On The World Wide Web”, Proc Microscopy & Microanalysis 1995 (1995), John F. Mansfield, Eds. G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p658-659
  41. "In-situ Atomic Force Microscopy of Pt/Ti Film Morphology Changes On A Microelectronic Gas Sensor Operating At Elevated Temperatures.”, M. DiBattista, S.V. Patel, J.F. Mansfield, J.L. Gland, J.W. Schwank, Proc Microscopy & Microanalysis 1995 (1995), Eds.G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p254-255.
  42. “Chemical Pressure and Charge Density  Waves in Rare Earth Tellurides”, E. DiMasi, M.C. Aronsen, J. F. Mansfield, B. Foran & S. Lee, Physical Review B 52 (1995) p14516.
  43. “Release Behavior from Ethylcellulose Coated Pellets:  Thermomechanical and Electron Microbeam Studies”,  G.M. Derbin, B.O. Palsson, J.F. Mansfield, T.A. Wheatley, J.B. Dressman, Pharm. Tech. 1996.
  44. “Surface Roughness Characterization of Nicalon and HI-Nicalon Ceramic Fibers by Atomic Force Microscopy," N. Chawla, J.W. Holmes, and J.F. Mansfield," Materials Characterization, 35 (1995) pp199-206.
  45. “The Teaching SEM  - An Example of Real-Time Remote Control SEM”, John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 394.
  46. “Digital Imaging - When Should One Take The Plunge?” John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 602.
  47. “A Survey of Detector Options for the “Leaky-Vacuum” SEM, Stuart McKernan & John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 832.
  48. “Characterization of Multilayer Thin Film Structures for Gas Sensor Applications”, M. DiBattista, S.V. Patel, K. D. Wise, J. L. Gland, J. Mansfield, and J. W. Schwank, in MRS, Vol. 382,  Structure and Properties of Multilayered Thin Films, T. D. Nguyen, B.M. Lairson, B. M. Clemens, K. Sato, S.-C. Shin, Eds., 1995.
  49. “Biological and Materials Science Applications of Environmental Electron Microscopy”, John F. Mansfield, Journal of The Electron Microscopy Society of Thailand, 11 (1996) 22.
  50. “Applications of the Environmental Scanning Electron Microscope”, John Mansfield, Proceedings of EUREM 1996, Dublin Eire.  Published on CD-ROM.
  51. "Review of Techniques for Overcoming XEDS Problems in the Environmental Scanning Electron Microscope", John F. Mansfield, Microscopy & Microanalysis, 3 Supplement 2 (1997) Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 1207.
  52. "TEM Studies of Silicon Nitride-Silicon Carbide Nanocomposites" E.Y. Wang, X. Pan, J.F. Mansfield, T. Kennedy & S. Hampshire", Microscopy & Microanalysis, 3 Supplement 2 (1997) Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 411.
  53. “A Microfabricated Hot Stage for Scanning Probe Microscopes, Michael DiBattista, Sanjay V. Patel, John F. Mansfield, John L. Gland, and Johannes W. Schwank , submitted to Scanning 1998.
  54. “In-situ elevated temperature imaging of thin films with a microfabicated hot stage for scanning probe microscopes”, Michael DiBattista, Sanjay V. Patel, John F. Mansfield & Johannes W. Schwank, Applied Surface Science 141 (1999) p119-128.
  55. “Quicktime as a Storage Medium for Dynamic Date Sets in In-Situ Electron Microscopy”, John F. Mansfield, Microscopy and Microanalysis 4 (1998) 4.
  56. “A Telepresence Microscopy Research Session in the DOE2000 Materials Microcharacterization Collaboratory”, L.F. Allard, E. Voelkl, T.A. Nolan, C.K. Narula, C. Montreuil, W.C. Bigelow and J.F. Mansfield, Microscopy and Microanalysis 4 (1998) 20.
  57. “Real-Time Remote Control of a Scanning Electron Microscope across the vBNS/Internet2”, John F. Mansfield, Microscopy and Microanalysis 4 (1998) 44.
  58. “X-ray Energy Dispersive Spectroscopy in the Environmental Scanning Electron Microscope”, John F. Mansfield and Brett L. Pennington, Microscopy and Microanalysis 4 (1998) 182.
  59. “Design and Construction of a Quantitative Uniaxial Straining Stage for the Environmental SEM”, John F. Mansfield, Micheal D. Thouless, Justin A. Stefano and Judd Holbrook, Microscopy and Microanalysis 4 (1998) 268.
  60. “Determination of lattice parameter, oxidation state, and composition of individual titanomagnetite/titanomaghemite grains by transmission electron microscopy”, Weiming Zhou, Donald R. Peacor, Rob Van der Voo, and John F. Mansfield, 1999. Journal of Geophysical Research, 104 (1999) 17689-17702.
  61. John F. Mansfield, “An Introduction to Electronic Document Preparation and Submission for Future Microscopy and Microanalysis Meetings”, Microscopy and Microanalysis, 5 (Suppl. 2: Proceedings) (1999), 520-521.
  62. “Environmental SEM Study of Sodium Alginate Beads”, John Mansfield, Petra Eiselt, Julia Yeh and David J. Mooney, Microscopy and Microanalysis, 5 (Suppl. 2: Proceedings) (1999) 300-301
  63. “Full, Real-Time Remote Control Of A Scanning Electron Microscope With A Compact Laptop Computer Via A High Speed Network”, John F. Mansfield, Andy Adamson & Kevin Coffman, Microscopy and Microanalysis 6 (2000) 31-41.
  64. “X-ray Microanalysis in the Environmental SEM: A Challenge or a Contradiction?”, John F. Mansfield,  Mikrochimica Acta, 132 (2000) 137-143.
  65. “Bismuth Nanowire Arrays: Syntesis and Galvanometric Properties”, J.M. Heremans, C.M. Thrush, Yu-min Lin, S. Cronin, Z. Zhang, M.S. Dresselhaus & J.F. Mansfield, Physical Review B, 61 (2000) 2921-2930.
  66. Murphy PJM, Morishima Y, Chen H, Galigniana MD, Mansfield JF, Simons SS and Pratt WB: Visualization and Mechanism of Assembly of a Glucocorticoid Receptor-hsp70 Complex that is Primed for Subsequent hsp90-Dependent Opening of the Steroid Binding Cleft, Journal of Biological Chemistry 278(37): 34764-34773, 2003.
  67. Harrell JM, Murphy PJM, Morishima Y, Chen H, Mansfield JF, Galigniana MD, Pratt WB: Evidence for glucocorticoid receptor transport on microtubules by dynein, Journal of Biological Chemistry, 279(52): 54647-54654, 2004.
  68. Paul A Anzalone, John F Mansfield, Lucille A Giannuzzi, “DualBeam Milling and Deposition of Complex Structures Using Bitmap Files and Digital Patterning” Microscopy and Microanalysis, Volume 10, Supplement S02, Aug 2004, pp 1154-1155
  69. JBennett MC, van Lierop J, Berkeley EM, Mansfield JF, Henderson C, Aronson MC, Young  DP, Bianchi A, Fisk Z, Balakirev F, Lacerda  A, Weak ferromagnetism in CaB6, Physical Review B,  69, 13 p132407 2004.
  70. Chen H, Clarkson BH, Sun K, Mansfield JF: Self-assembly of synthetic hydroxyapatite nanorods into an enamel prism-like structure, Journal of Colloid and Interface Science 288 (2005), p97-103.
  71. Chen H, Sun K, Tang Z, Law RV, Mansfield JF, Clarkson BH: Synthesis of Fluorapatite Nanorods and Nanowires by Direct Precipitation from Solution, Crystal Growth & Design, 6, 1504-1508 2006.
  72. Chen H, Tang Z, Liu J, Sun K, Chang SR, Peters MC, Mansfield JF, Clarkson BH: Acellular synthesis of a Human Enamel-like Microstructure, Advanced Materials, 18 p1846, 2006.
  73. Chen, H; Czajka-Jakubowska, A; Spencer, NJ, et al. “Effects of systemic fluoride and in vitro fluoride treatment on enamel crystals, Journal Of Dental Research”, 85 pp1042-1045, 2006.
  74. John Mansfield, John Nees, Gerard Mourou and Almantas Galvanauskas, “High Quality Electron Beams from Laser Wakefield Acceleration: A New Compact Source for Electron Microscopes?” Microscopy & Microanalysis 11 (2005), Supplement 2, 482.
  75. John Mansfield, Rachel Goldman, Richard Laine and Max Shtein, “Nanofabrication with Ion Beams Visualized in the Environmental Scanning Electron Microscope” Microscopy & Microanalysis 11 (2005), Supplement 2, 1350.
  76. Kalyani Chaganti, Ildar Salakhutdinov, Ivan Avrutsky, Gregory W. Auner, John Mansfield "Sub-micron grating fabrication on hafnium oxide thin-film waveguides with focused ion-beam milling", Optics Express, Vol. 14, Issue 9 (May 2006), pp. 4064-4072.
  77. "High Refractory, Low Misfit Ru-Containing Single Crystal Superalloys" by Laura Carroll, Qiang Feng, John Mansfield, and Tresa Pollock, Met Trans 37A (2006) pp2927-2938.
  78.   “Elemental partitioning in Ru-containing nickel-base single crystal superalloys” Carroll, LJ, Feng, Q, Mansfield, JF and Pollock TM, Materials Science And Engineering A-Structural Materials Properties Microstructure And Processing (2007) 457 pp 292-299.
  79.   “Characterization and Restoration of 19th Century Daguerreotypes by SEM XEDSand FIB”, EA Gregory, CS DeRoo and JF Mansfield, Microscopy and Microanalysis, Volume 13, Supplement S02, Aug 2007, pp 1422-1423.
  80. “SEM and XEDS Fingerprinting of the Second World War Era Medals to Identify Counterfeits”, A Aneja, D Maerz and JF Mansfield, Microscopy and Microanalysis, Volume 13, Supplement S02, Aug 2007, pp 1420-1421.
  81. “FIB Methods and Applications in the Modern Analytical Laboratory”, John Mansfield and Joe Michael, Proceedings of ACMM-20 and IUMAS-IV “Through the Looking Glass”, 2008 p193-4.
  82. “Remote Microscopy, FIB and Microprobe - Technique Teaching for Large Groups”, John F. Mansfield, Acta Microscopica Vol 16 No1-2, (Supp.2) 2007, Article 2.
  83.   “Remote Microscopy, FIB and Microprobe - Technique Teaching for Large Groups”, John F. Mansfield, Proceedings of XXI CSBMM 2007.
  84. “Daguerreotypes and Focused Ion Beams – A Novel Route To Restoration?, Elise A Gregory, Matthew Parayil, Cathy Selvius Deroo & John F. Mansfield. Acta Microscopica Vol 16 No1-2, (Supp.2) 2007, Article 86.
  85. “Remote Microscopy for Training Groups of Student Users”, John F. Mansfield, Proceedings of ACMM-20 and IUMAS-IV “Through the Looking Glass”, 2008 p146-147.
  86. ”Single Particle Plasmon Spectroscopy of Silver Nanowires and Gold Nanorods” M. N’Gom,, J. Ringnalda, J. F. Mansfield, A. Agarwal, N.Kotov, N.J. Zaluzec, T.B. Norris, Nano Letters 8, 3200-3204 (2008).
  87. “Formation and coarsening of Ga droplets on focused-ion-beam irradiated GaAs surfaces”, J. H. Wu, W. Ye, B. L. Cardozo, D. Saltzman, K. Sun, H. Sun, J. F. Mansfield, and R. S. Goldman, Applied Physics Letter, 95, 153107 (2009).
  88. Ranney, Elizabeth; Mansfield, John; Sun, Kai; Schwank, Johannes; Effects of synthesis conditions on dimensions, structure, and oxygen content of photocatalytically active titania nanotubes, Journal of Materials Research, 25, 89-95 (2010).
  89. Ryan D. Murphy, Michael J. Abere, Huanan Zhang, Haiping Sun, Ben Torralva, John F. Mansfield, Nicholas A. Kotov, and Steven M. Yalisove; Ultrafast laser orthogonal alignment and patterning of carbon nanotube-polymer composite films, Appl. Phys. Lett. 101, 203301 (2012).



Service (2000-present) 

  1. Member of Jeremy Busby’s PhD Thesis Committee 2000.
  2. Member of UM’s EMAL/SPRL Safety Committee 1999-2013.
  3. Microbeam Anlaysis Society – Computer Activities Chair and Webmaster 1996-2003.
  4. Co-Chair (with Alwyn Eades of Lehigh University) of “Advances in Electron Diffraction” a special symposium at The International Union of Microbeam Analysis Societies 2000 Meeting in Kona, Hawaii, July 9th-14th 2000.
  5. Co-Chair (with Brad Thiel, Cambridge University and Dale Newbury, NIST) of Symposium V: Low Vacuum SEM/ESEM in Materials Science - Wet SEM - the Liquid Frontier of Microscopy, Fall Meeting of MRS, Boston, Mass, Nov 27th – Dec 1st 2000.
  6. Reviewed the Materials Science Center at Bowling Green State University with Kathy Kash of the Physics Department of Case-Western Reserve University, January 30th – February 1st 2000.
  7. Co-Chair (with Alwyn Eades of Lehigh University) of “Advances in Electron Diffraction” a special symposium at The International Union of Microbeam Analysis Societies 2000 Meeting in Kona, Hawaii, July 9th-14th 2000.
  8. Co-Chair (with Brad Thiel, Cambridge University and Dale Newbury, NIST) of Symposium V: Low Vacuum SEM/ESEM in Materials Science - Wet SEM - the Liquid Frontier of Microscopy, Fall Meeting of MRS, Boston, Mass, Nov 27th – Dec 1st 2000.
  9. Physical Sciences Director (elected position) of the Microscopy Society of America 2001 - 2003
  10. Member of the Editorial Board of Microscopy and Microanalysis, the official journal of The Microscopy Society of America 2004-present.
  11. Member of the Facilities Advisory Board for the Central Analytical Facility at the University of Alabama, October 15th-17th 2006 and November 4th-6th 2007.
  12. Microanalysis Editor for Microscopy and Microanalysis 2008-present.
  13. Program Co-Chair of Microscopy and Microanalysis 2009
  14. Program Chair of Microscopy and Microanalysis 2010.
  15. Microanalysis Society President-Elect 2011 (Jan-Aug).
  16. University of Michigan Government Relations Advisory Committee 2004-Present.
  17. Communications Advisory Committee 2004 - Present 
  18. Committee for the Economic Status of the Faculty 2005-2008 and CESF 2012-Present.
  19. Senate Assembly (alternate for Levi Thompson while he was on sabbatical) 2009-2010.
  20. Senate Assembly 2011-2014
  21. Member of the Advisory Committee for the 11th Interamerican Conress on Microscopy (CIASEM), September 25-29th 2011.
  22. Co-Chair with Cathy Selvius DeRoo and Alex Ball of “Microscopy & Microanalysis Applications in Cultural Heritage Research”, a symposium at Microscopy & Microanalysis 2011, Nashville Tennessee, August 7th-11th 2011.
  23. Microanalysis Society President 2011-12.
  24. Microanalysis Society Past-President 2012-14.
  25. Co-Chair with Cathy Selvius DeRoo and Alex Ball of “The Art in Microscopy & Microanalysis”, a symposium at Microscopy & Microanalysis 2013, Indianapolis, Indiana, August 4th-8th 2013.
  26. University Michigan, College of Engineering Rules Committee, 2013-2016.



Curriculum Vitae of John F. Mansfield 4/12/13 1