SEM Image of Au Coated AFM Tip
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.
Carbon Nanotubes Modified with an Ultrafast Laser
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
SADP
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.
Image by John Mansfield
O Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Porous Si at High Magnification
SEM image of porous silicon.
Image by EMAL Staff
Carbon Nanotubes Modified with an Ultrafast Laser
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
SEM Image of Au Coated AFM Tip
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.