BF STEM Image of Copper Aluminum Precipitates
A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
TEM image of Anatase and Rutile
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.
Image by John Mansfield
Dislocations in Si-Ge Thin Film
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Carbon Nanotubes Modified with an Ultrafast Laser
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Si Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Carbon Nanotubes Modified with an Ultrafast Laser
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
BF STEM Image of Copper Aluminum Precipitates
A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI