Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.
Image by John Mansfield
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.
Image by John Mansfield
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.
Image by John Mansfield
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the FEI Nova 200 Nanolab Dualbeam FIB in room 426 of the North Campus EMAL. The image is brought to you from a Sony EVI-D30 Video Camera via an Axis 2400 Video Server.
Pan-Tilt control of this video camera is available to users who have a password.
