SEM image of porous silicon.
Image by EMAL Staff
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
SEM image of porous silicon.
Image by EMAL Staff
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.
Image by John Mansfield
An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
SEM image of porous silicon.
Image by EMAL Staff
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the Digital Instruments Nanoscope IIIa SPM in room 415 of the North Campus EMAL. The image is brought to you via an Axis 2100 Network Camera.
