Geological XEDS Map
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
Dislocations in Si-Ge Thin Film
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Porous Si at High Magnification
SEM image of porous silicon.
Image by EMAL Staff
ZnO crystals grown on Carbon Nanotubes
ZnO "barbed wire" crystals grown on carbon nanotubes.
Image by John Hart Group
Al Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
BF and DF pair of Gamma/Gamma'
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.
Image by EMAL Staff
Geological XEDS Map
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt