EMAL | Educational Materials & Publications

Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.

Image by John Mansfield

Si CBED
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.

Pattern by John Mansfield
HREM Twin
Twin detail in alloy foil in HREM.
Si Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield
Dislocations in Si-Ge Thin Film
TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield
Al Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.

Image by John Mansfield

EMAL Videos

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4/22	Introduction to FIB Instrumentation Lecture 1, given by Lucille Giannuzzi, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008.
4/22	Imaging with Ions Lecture 3a, given by Joe Michael, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008.
4/22	Imaging with Ions Lecture 3b, given by Joe Michael, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008.
4/22	Ion Solid Interactions Lecture 2, given by Joe Michael, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008
4/23	SEM in the FIB Lecture 5, given by Joe Michael, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008.
4/23	Micro and Nano Fabrication: Milling and Deposition for Nanoprototyping and Circuit Edit Lecture 4, given by Lucille Giannuzzi, of "A Workshop on Focused Ion Beam Systems and Applications" 23rd April 2008.
4/24	TEM Samples in the FIB Lecture 6, given by Lucille Giannuzzi, of "A Workshop on Focused Ion Beam Systems and Applications" 24th April 2008.
4/24	Milling and Deposition with the Aid of Gas Sources Lucille Giannuzzi, FEI Company, a special EMAL Techniques Seminar, September 24th, 2009. 24th April 2008. Please excuse the audio in the later parts of this presentation, there is some interference on the wireless microphone, I hope things are still decipherable.

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