Porous Si at High Magnification
SEM image of porous silicon.
Image by EMAL Staff
SEM image of porous silicon.
Image by EMAL Staff
SEM image of porous silicon.
Image by EMAL Staff
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.
Pattern by John Mansfield
Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.
Twin detail in alloy foil in HREM.
Scanning electron microscope image a cluster of nanotubes of cadmium telluride.
Image by John Mansfield
SEM image of porous silicon.
Image by EMAL Staff
This EMAL Videos section contains a series of presentations that were recorded with the College of Engineering's Lecture Capture System. This system records not only the slides presented to the audience, but also syncs them with audio and video of the presenter. This system was developed in the College of Engineering in 2005 by Phil Treib, the Computer Aided Engineering Network's director of instructional technology (see here). EMAL presentations will typically be recorded and made available on this section of the EMAL Web Site.