TEM image of dislocations in a silicon and silicon-gremanium thin film system.Image by John Mansfield
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.Image by Bob Anderhalt
Medium magnification image of 500nm film of NiTi sputtered on carbon nanotube forest. SE image on Nova Nanolab taken at 10 kV.Image taken by Anne Juggernauth
Surface carbides formed during carburization of experimental W- and Re-rich Ni-base superalloys. BSE image recorded on Philips XL30 FEGSEM at 20kV.Image by Raghav Adharapurapu, Prof. Pollock's Research Group
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.Image by John Mansfield
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