Scanning electron microscope image a cluster of nanotubes of cadmium telluride.Image by John Mansfield
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.Image by John Mansfield
SE image of a PGM-modified NiAl Bond Coat deposited on Rene N5 Ni-superalloy substrate that underwent cyclic oxidation at 1150 deg C for 512 cycles. SE image recorded on Philips XL30 ESEM at 20kV.Image by Raghav Adharapurapu, Prof. Pollock's Research Group
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.Image by EMAL Staff
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