Porous Si at Low Magnification
SEM image of porous silicon.
Image by EMAL Staff
SEM image of porous silicon.
Image by EMAL Staff
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.
Image by John Mansfield
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
SEM image of porous silicon.
Image by EMAL Staff
The EMAL 40th Anniversary Symposium was held on October 19th and 20th, 2009, from
8:00am - 5:30pm in 1670 Computer Science & Engineering, on the North Campus of the University of Michigan
This symposium was organized by John Mansfield in order to celebrate the establishment, in 1969 of the University of Michigan Electron Microbeam Analysis Laboratory. The lab was established by Professor Wilbur C. Bigelow, then a professor of Chemical and Metallurgical Engineering. The first instruments purchase were an electron microprobe analyzer and a scanning electron microscope. The EMAL history continues...
The EMAL 40th Symposium was held in conjunction with the Materials Science and Engineering (MSE) Annual Van Vlack Lecture series. The presentations for the main body of the symposium were all alumni of EMAL from across the years and the Van Vlack Lecturer presented a keynote lecture at the end of the day. The Van Vlack Lecturer for 2009 was Professor Edwin L. (Ned) Thomas, the Morris Cohen Professor of Materials Science and Engineering and Head of the Department of Materials Science and Engineering at Massachusetts Institutie of Technology. The close ties between UM's MSE and EMAL meant that this merger of events allowed not only a economy of scale, but an expanded platform of speakers.
The symposium was a two day event, a day of presentation, followed by a reception and dinner, and then a second day of presentations. The first day featured an opening presentation, jointly presented by Wil Bigelow and John Mansfield, on the history and development of the Electron Microbeam Analysis Laboratory. There then followed presentations by five alumni of the facility, some of whom had been at Michigan at the beginning. During the afternoon coffee break on the first day,a student poster competition showcased current student research based in EMAL.
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Note
Archive copies of the EMAL 40th Symposium Poster and Schedule and Abstracts Booklet are available if you are interested.