Scanning electron microscope image a cluster of nanotubes of cadmium telluride.
Image by John Mansfield
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.
Image by EMAL Staff
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.
Pattern by John Mansfield
Scanning electron microscope image a cluster of nanotubes of cadmium telluride.
Image by John Mansfield
Phone: 763-1041, 936-3349, or 936-3350
There are currently no undergraduate research assistants working in EMAL. If you would like to work for EMAL, please send email to John Mansfield. We welcome student workers who want laboratory experience, particularly Work Study students.
