Si CBED
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.
Pattern by John Mansfield
Porous Si at Low Magnification
SEM image of porous silicon.
Image by EMAL Staff
Porous Si at High Magnification
SEM image of porous silicon.
Image by EMAL Staff
O Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
X-ray Composite Map of Chip
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.
Image by John Mansfield
M23X6 Crocodile
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.
Image by John Mansfield
Si CBED
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.
Pattern by John Mansfield
