Geological XEDS Map
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.
Image by John Mansfield
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.
Image by John Mansfield
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.
Pattern by John Mansfield
Twin detail in alloy foil in HREM.
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
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EMAL Committee Member & Associate Professor Address: |
E-mail: panx@engin.umich.edu
Phone: (734) 647-6822
Fax: (734) 763 4788
Homepage: http://msewww.engin.umich.edu/research/groups/pan/
Research Interests:
Current research involves the structure/property relationships in both functional and structural ceramics. High Resolution Transmission Electron Microscopy (HRTEM), in combination with Analytical Electron Microscopy (AEM), are utilized to study the bulk ceramics and/or thin films of chemical sensors, ferroelectrics, and silicon nitride-based materials. Physical and chemical deposition techniques are used to prepare the films. Problems under investigation include interfacial structure and chemistry, grain growth, defects, segregation behavior, and electrical properties. Considerable emphasis is placed on understanding the atomistic structure and chemistry of ceramic/ceramic and metal/ceramic interfaces.