Geological XEDS Map
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
Si CBED
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.
Pattern by John Mansfield
Al Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
Porous Si at Low Magnification
SEM image of porous silicon.
Image by EMAL Staff
HREM image of grains of silicon nitride
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
BF STEM Image of Copper Aluminum Precipitates
A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
Geological XEDS Map
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
